vti_encoding:SR|utf8-nl vti_timelastmodified:TR|27 Jan 2000 18:05:00 -0000 vti_extenderversion:SR|4.0.2.2717 vti_filesize:IR|902 vti_title:SR|Initial Wafer Characterization -Metals, Particles & Microroughness vti_metatags:VR|HTTP-EQUIV=Context-Type GENERATOR Microsoft\\ Internet\\ Assistant\\ for\\ PowerPoint\\ 97 vti_generator:SR|Microsoft Internet Assistant for PowerPoint 97 vti_backlinkinfo:VX|teleseminars/1998/may/7/keason/keason_may98/tsld013.htm teleseminars/1998/may/7/keason/keason_may98/tsld005.htm teleseminars/1998/may/7/keason/keason_may98/tsld003.htm teleseminars/1998/may/7/keason/keason_may98/tsld001.htm teleseminars/1998/may/7/keason/keason_may98/tsld016.htm teleseminars/1998/may/7/keason/keason_may98/tsld018.htm teleseminars/1998/may/7/keason/keason_may98/tsld008.htm teleseminars/1998/may/7/keason/keason_may98/tsld012.htm teleseminars/1998/may/7/keason/keason_may98/tsld014.htm teleseminars/1998/may/7/keason/keason_may98/tsld004.htm teleseminars/1998/may/7/keason/keason_may98/tsld010.htm teleseminars/1998/may/7/keason/keason_may98/sld001.htm teleseminars/1998/may/7/keason/keason_may98/tsld002.htm teleseminars/1998/may/7/keason/keason_may98/tsld017.htm teleseminars/1998/may/7/keason/keason_may98/tsld019.htm teleseminars/1998/may/7/keason/keason_may98/tsld006.htm teleseminars/1998/may/7/keason/keason_may98/tsld009.htm teleseminars/1998/may/7/keason/keason_may98/tsld015.htm teleseminars/1998/may/7/keason/keason_may98/tsld007.htm teleseminars/1998/may/7/keason/keason_may98/tsld011.htm vti_sourcecontrolversion:SX|V1 vti_sourcecontrolcookie:SX|fp_internal vti_nexttolasttimemodified:TR|11 Jan 2000 17:14:56 -0000 vti_author:SR|eric vti_modifiedby:SR|sclement vti_timecreated:TR|11 Jan 2000 17:14:56 -0000 vti_cacheddtm:TX|27 Jan 2000 18:05:00 -0000 vti_cachedlinkinfo:VX|H|../keason_may98/tsld002.htm H|../keason_may98/tsld001.htm H|../keason_may98/sld001.htm vti_cachedsvcrellinks:VX|FHUS|Teleseminars/1998/May/7/KEason/keason_may98/tsld002.htm FHUS|Teleseminars/1998/May/7/KEason/keason_may98/tsld001.htm FHUS|Teleseminars/1998/May/7/KEason/keason_may98/sld001.htm vti_cachedtitle:SR|Initial Wafer Characterization -Metals, Particles & Microroughness vti_cachedbodystyle:SR| vti_cachedhasbots:BR|false vti_cachedhastheme:BR|false vti_cachedhasborder:BR|false