Post-CMP Cleaning

9/30/98


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Table of Contents

Post-CMP Cleaning

Experimental Equipment (IPEC Planar Avanti 9000)

PPT Slide

Experimental Approach

Experimental Limitations

Experimental Parameters

Sample Results

DOE Results (I)

DOE Results (II) (significant effects on the actual responses)

Summary of Results

Particle Adhesion

Adhesion Forces

Adhesion Forces in Solution

Adhesion Calculations

Model of Brush

Particle Removal By Shear

Shear-Based Removal

Shear-Based Removal

Conclusions: Brush Dynamics

Acknowledgment

Author: Gzhang

Email: steve.beaudoin@asu.edu