Deposition of Low and Ultra-Low k Dielectrics by ESH Benign CVD Pathways

10/12/98


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Table of Contents

Deposition of Low and Ultra-Low k Dielectrics by ESH Benign CVD Pathways

Objective

ILD Lifecycle and ESH Impact

Chemical Vapor Deposition

Process: Pulsed PECVD

Process: Precursor Gas Selection

Process: Effluent Analysis

Structure: Variation with Duty Cycle I

Structure: Variation with Duty Cycle II

Structure: Variation with Precursor Gas I

Structure: Variation with Precursor Gas II

Structure: Variation with Precursor Gas III

Structure: Comparing NMR and XPS Quantitation I

Structure: Comparing XPS and NMR Quantitation II

Property: Dielectric Constant

Property: Thermal Stability vs Duty Cycle

Property: Thermal Stability vs Precursor Gas

Summary: Pulsed PECVD

Future Work: Motivation

Future Work: Pyrolytic CVD

Future Work: Initial Studies

Acknowledgments

Author: Karen K. Gleason