Probing the Chemistry of Electronic Materials Processing

10/21/98


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Table of Contents

Probing the Chemistry of Electronic Materials Processing

CVD and Etching Processes

Surface Analytical Techniques

Experimental Approach

Multiple Internal Reflection Fourier Transform Infrared (MIR-FTIR) Spectroscopy

Process Chamber

Research Areas

Growth Methods for Amorphous Semiconductors

Growth of a-SixC1-x:H Films

Thermal Reactivity of a-SiC:H Films

Hydrogen-Alkane Plasma Etching System

Goals of Project

CH4/H2 Plasma: Growth Conditions

NEXAFS Studies

Schematic Structure of Deposited Film

CH4/H2 Plasma: Sputter / Etch Conditions

Real-Time Mass Spectrometry

Role of Methyl Groups

Semiconductor Surface Reactivity

Organic Synthesis at the Surface

Cycloaddition reactions in organic chemistry

Infrared Spectra

Novel Surface Chemistries

Author: Stacey Bent

Email: sbent@leland.Stanford.EDU