PPT Slide
Misra et al. -- Experimental Details
- Wafer on spin-dry station
HF/HCl/H2O2(oxide etch) -> S/D -> SC2 oxide -> S/R/D
HF/HCl/H2O2(oxide etch) -> S/D
- All-teflon static contamination bath: pH=~5.6
- Ca (0.02ppb- 10ppb) in DI water
- Surface Ca analysis: VPD-DC-AAS
AFM for surface morphology